Module

Voraussetzungen

Inhalte

• Types of measurement errors (systematic/random) and how to account for • Analytical consideration of errors and error propagation • Principles, properties and use of - Raman Spectroscopy - Optical Coherence Tomography - Digital Holographic Microscopy - Ultrasound Spectroscopy - X-Ray Diffractometer - Mass Spectroscopy

Lernziele

After successful completion of the module, students have in-depth knowledge in the field of silicon-based microsystems technology, especially in the area of microsensor technology. They are able to analyze problems in this field and to develop solutions to problems, In addition, social competencies such as the ability to cooperate, as well as other individual competencies such as diligence, perseverance, curiosity, initiative, frustration tolerance, etc. were promoted in the students.

Prüfungsleistung

Prerequisite: • Successful seminar talk (with written handout) Final module examination: • Oral examination, 30-45 min

Bemerkungen

• Study programme Physics M.Sc.: Compulsory elective module in complex „Physical Specialization with Experimental Focus“, topic area „Nanophysics“